Semiconductor integrated circuit and abnormal oscillation detection method for semiconductor integrated circuit

ABSTRACT

A semiconductor device includes a first oscillator that generates a first clock signal, a second oscillator that generates a second clock signal in response to the first clock signal, a third oscillator that generates a third clock signal, a counter that counts a signal corresponding to the first clock signal or a signal corresponding to the second clock signal during a predetermined period that is set based on the third clock signal to generate an overflow signal indicating that a count value of the signal corresponding to the first clock signal or the signal corresponding to the second clock signal exceeds a predetermined value, and an abnormality notice unit that receives the overflow signal to generate an abnormal signal indicating that an abnormal oscillation occurs in at least one of the first to third clock signals.

INCORPORATION BY REFERENCE

The present application is a Continuation Application of U.S. patent application Ser. No. 12/923,164, filed on Sep. 7, 2010, now U.S. Pat. No. 8,248,169 which is based on and claims priority from Japanese patent application No. 2009-206878, filed on Sep. 8, 2009, the entire contents of which is incorporated herein by reference.

BACKGROUND

1. Field of the Invention

The present invention relates to a semiconductor integrated circuit and an abnormal oscillation detection method for the semiconductor integrated circuit. In particular, the present invention relates to a clock monitor technique of a semiconductor integrated circuit with plural clocks.

2. Description of Related Art

In recent years, there is advanced speed-up of a semiconductor integrated circuit along with making to a highly-functionalization and a highly performance of a system. For it achieves a speed-up of the semiconductor integrated circuit at low power consumption and low price, an oscillator is a conventional composition. For example, a semiconductor integrated circuit according to Japanese Unexamined Patent Application Publication No. 2006-172202 equips with a PLL (Phase Locked Loop) multiplying a clock of the oscillator, and uses a clock of the PLL as an operation clock of a microcomputer.

FIG. 5 is a block diagram showing a semiconductor integrated circuit according to Japanese Unexamined Patent Application Publication No. 2006-172202. The semiconductor integrated circuit 100 includes an oscillator 201, a PLL 301, an abnormal oscillation detection unit 401, a flash ROM (Read Only Memory) 501, a CPU (Central Processing Unit) 601, and plural peripheral devices (701-1-701-n: n is a natural number). The abnormal oscillation detection unit 401 includes an internal reset signal generation circuit 801 (reset generator), and a clock monitor 901. The internal reset signal generation circuit 801 includes a signal generation unit 104.

The oscillator 201 receives a first oscillator output signal supplied from a first oscillator input terminal 101 and a second oscillator input signal supplied from a second oscillator input terminal 102, and outputs a clock signal 21 (an oscillator output signal). The oscillator output signal 21 output from the oscillator 201 is supplied to each the PLL 301 and the clock monitor 901. The PLL 301 receives the oscillator output signal 21, generates a PLL output signal 231, and outputs the PLL output signal 231 to the CPU 601. The clock monitor 901 generates an abnormal oscillation detection signal 241 based on the oscillator output signal 21 and a clock (ring oscillator output signal) 221 supplied from the flash ROM 501, and outputs the abnormal oscillation detection signal 241 to the internal reset signal generation circuit 801. The internal reset signal generation circuit 801 generates an internal reset signal 251 based on a reset signal 271 supplied from a terminal reset signal input terminal 103 and the abnormal oscillation detection signal 241 supplied from the clock monitor 901 and outputs the internal reset signal 251 to the CPU 601.

Therefore, when it occurs an abnormal oscillation of the oscillator output signal 21 supplied from the oscillator 201, it can stop appropriately an operation of the semiconductor integrated circuit 100, corresponding the abnormality. In this case, the semiconductor integrated circuit 100 measures a clock frequency of the oscillator output signal 21 with the ring oscillator output signal 221 supplied from the flash ROM 501, at the clock monitor 901. The semiconductor integrated circuit 100 monitors the operation of the oscillator 201 by comparing the measured clock frequency with a comparison value provided beforehand. The comparison value indicates a frequency of a predetermined range (guaranteed operating range). For example, when the semiconductor integrated circuit 100 is designed to operate in corresponding the oscillator output signal 21 of a range of 5 MHz to 7 MHz, the abnormal oscillation detection unit 401 generates the abnormal oscillation detection signal 241 when it detects a frequency (for examples, a frequency of 8 MHz) out of the comparison value. Therefore, when a signal including a high-frequency content (for example, the above-mentioned frequency content of 8 MHz) exceeded a clock frequency at normal times is output from the oscillator 201, the semiconductor integrated circuit 100 determines that the high-frequency content is an abnormal oscillation, and stops operations of the CPU 601 and the peripheral device (701-1-701-n).

Further, a semiconductor integrated circuit according to Japanese Unexamined Patent Application Publication No. 2002-41178 divides a PLL output signal with a frequency divider, and determines whether it occurs an abnormal oscillation in PLL output signal with a divider clock frequency and input clock.

SUMMARY

The semiconductor integrated circuit 100 according to Japanese Unexamined Patent Application Publication No. 2006-172202 is a composition detecting an abnormal oscillation by the clock monitor 901. However, the semiconductor integrated circuit 100 might not be able to detect an abnormal oscillation of a clock. That is, the semiconductor integrated circuit 100 can not detect an abnormal oscillation of the oscillator output signal 21, when it occurs an abnormal oscillation of the ring oscillator output signal 221.

It is because that the semiconductor integrated circuit 100 assumes the ring oscillator output signal 221 supplied from the flash ROM 501 as a sampling clock, and measures the oscillator output signal 21 at the clock monitor 901. Therefore, when it occurs an abnormal oscillation of the ring oscillator output signal 221, or when the output of the ring oscillator output signal 221 stops, it does not normally measure the oscillator output signal 21 at the clock monitor 901, and can not generate the abnormal oscillation detection signal 241.

Additionally, the clock monitor 901 has only a function to measure the oscillator output signal 21. Therefore, the semiconductor integrated circuit 100 can not detect an abnormal oscillation of the ring oscillator output signal 221 and the PLL output signal 231.

It is because that the ring oscillator output signal 221 has only a role as a sampling clock to measure the oscillator output signal 21. Therefore, there is no clock and function to monitor the ring oscillator output signal 221 own. Further, the semiconductor integrated circuit 100 has no means to measure the PLL output signal 231 to detect an abnormal oscillation of the PLL output signal 231.

The semiconductor integrated circuit according to Japanese Unexamined Patent Application Publication No. 2002-41178 is a composition detecting an abnormal oscillation of a PLL output signal, however, can not detect an abnormal oscillation of a ring oscillator output signal.

The present invention is a semiconductor integrated circuit including: a first oscillator, a second oscillator, a third oscillator, a selector, and a determination circuit. The selector switches, in turn, based on a clock of the third oscillator, and outputs a clock of the first oscillator or a clock of the second oscillator. The determination circuit counts up or counts down the clock output from the selector, based on the clock of the third oscillator, determines the correspondence of the clock output from the selector and the clock of the third oscillator, based on a result of the counting up or the counting down, and determines whether either of the clock output from the selector or the clock of the third oscillator occurs an abnormal oscillation. Therefore, the semiconductor integrated circuit can determine whether either of the clock of the first oscillator, the clock of the second oscillator, or the clock of the third oscillator occurs an abnormal oscillation.

The present invention is an abnormal oscillation detection method for semiconductor integrated circuit. The method includes: switching, in turn, based on a clock of the third oscillator and outputting a clock of the first oscillator or a clock of the second oscillator; counting up or counting down the clock of the first oscillator or the clock of the second oscillator, based on the clock of the third oscillator; determining the correspondence of the clock of the first oscillator or the clock of the second oscillator and the clock of the third oscillator, based on a result of the counting up or the counting down. Therefore, the semiconductor integrated circuit can determine whether either of the clock of the first oscillator, the clock of the second oscillator, or the clock of the third oscillator occurs an abnormal oscillation.

According to the present invention, it is possible to provide that a semiconductor integrated circuit and an abnormal oscillation detection method for the semiconductor integrated circuit can determine whether either of the oscillator output signal, the PLL output signal, or the ring oscillator output signal occur an abnormal oscillation.

BRIEF DESCRIPTION OF THE DRAWINGS

The above and other exemplary aspects, advantages and features will be more apparent from the following description of certain exemplary embodiments taken in conjunction with the accompanying drawings, in which:

FIG. 1 is a block diagram schematically showing a semiconductor integrated circuit according to a first exemplary embodiment of the present invention;

FIG. 2 is a timing diagram detecting an abnormal oscillation in a semiconductor integrated circuit according to a first exemplary embodiment of the present invention;

FIG. 3 is a block diagram schematically showing a semiconductor integrated circuit according to a second exemplary embodiment of the present invention;

FIG. 4 is a block diagram schematically showing a semiconductor integrated circuit according to a third exemplary embodiment of the present invention;

FIG. 5 is a block diagram schematically showing a semiconductor integrated circuit to a related art.

DETAILED DESCRIPTION OF THE EXEMPLARY EMBODIMENTS

Hereinafter, specific embodiments to which a semiconductor integrated circuit and an abnormal oscillation detection method for the semiconductor integrated circuit according to the present invention will be described. Note that, the present invention is not limited to following-described exemplary embodiments. Further, following descriptions and drawings arbitrarily simplify to illustrate specifically.

First Exemplary Embodiment

FIG. 1 shows a block diagram of a semiconductor integrated circuit 1 according to a first exemplary embodiment of the present invention.

The semiconductor integrated circuit 1 includes an oscillator 2 which is a first oscillator, a PLL 3 which is a second oscillator, a ring oscillator 4 which is a third oscillator, a frequency divider 5, a selector 6, and a determination circuit 7. Further, the semiconductor integrated circuit 1 includes a clock control unit 8, a CPU 9, and an abnormality notice unit 10. That is, the semiconductor integrated circuit 1 includes the oscillator 2, the PLL 3 multiplying an oscillator output signal 21, and the ring oscillator 4. The clock control unit 8 selects a PLL output signal 22 and a ring oscillator output signal 24 as an operation clock, and outputs the selected signal to the CPU 9, on the semiconductor integrated circuit 1. Further, the frequency divider 5 divides the PLL output signal 22, based on a multiple rate of the PLL 3.

The selector 6 receives the oscillator output signal 21, a frequency divider output signal 23, and the ring oscillator output signal 24. The selector 6 switches, in turn, based on the ring oscillator output signal 24, and outputs the oscillator output signal 21 or the frequency divider output signal 23 to the determination circuit 7.

The determination circuit 7 counts up or counts down the clock output from the selector 6, based on the ring oscillator output signal 24. Further, the determination circuit 7 determines the correspondence of the clock output from the selector 6 and the ring oscillator output signal 24, based on a result of the counting up or the counting down, and detects an abnormal oscillation of either of the oscillator output signal 21, the PLL output signal 22, or the ring oscillator output signal 24. The abnormal oscillation, in this case, shows a stop, a high-speed oscillation, and a low-speed oscillation of a clock frequency.

that is, the determination circuit 7 includes a count unit 11, a first determination unit 12, and a second determination unit 13. The count unit 11 receives a clock from the selector 6. For example, The count unit 11 counts up the oscillator output signal 21, which is one clock selected by the selector 6, as a clock to count. Otherwise, the count unit 11 counts down the frequency divider output signal 23, which is the other clock selected by the selector 6, as the clock to count. The count unit 11 switches either of a counting up operation or a counting down operation, based on a leading edge of the ring oscillator output signal 24. Otherwise, the count unit 11 might be a composition switching either a counting up operation or a counting down operation, based on a trailing edge of the ring oscillator output signal 24.

In the count unit 11, a value at the starting the counting up operation is set to “0” (first parameter). Further, in the count unit 11, a value at the switching from a counting up operation to a counting down operation is set to the oscillator output signal 21 (second parameter) for one cycle of the ring oscillator output signal 24 at normal time. Furthermore, in the count unit 11, a value at the finishing the counting down operation is set to “0” (third parameter). Therefore, when the semiconductor integrated circuit 1 operates normally, the oscillator output signal 21 and the frequency divider output signal 23 dividing a multiple rate of the PLL 3 are same frequency. That is, when the oscillator output signal 21, the PLL output signal 22 and the ring oscillator output signal 24 are normal, a counter value of which the oscillator output signal 21 is the clock to count and a counter value of which the frequency divider output signal 23 is the clock to count are same value.

In particular, at FIG. 2, it is assumed that t1 is a period which the count unit 11 counts the oscillator output signal 21 as a clock to count, and that t2 is a period which the count unit 11 counts the frequency divider output signal 23 as a clock to count. In this case, it consists that t1 is equals to t2, because each t1 and t2 corresponds to one cycle of the ring oscillator output signal 24. Therefore, when the count unit 11 counts up the oscillator output signal 21 as a clock to count under the t1 period and then the count unit 11 counts down the frequency divider output signal 23 as a clock to count under the t2 period, the counter value of the count unit 11 returns to “0”. Accordingly, the determination circuit 7 can determine that the oscillator output signal 21, the PLL output signal 22, and the ring oscillator output signal 24 are normal.

On the other hand, when it occurs a high-speed abnormal oscillation of the oscillator output signal 21, or it occurs a low-speed abnormal oscillation of the ring oscillator output signal 24, the counter value overflows the second parameter, when the count unit 11 counts up the oscillator output signal 21 (C in FIG. 2). Therefore, the count unit 11 generates an overflow signal 25 at the overflow, and outputs the overflow signal 25 to the abnormality notice unit 10. Accordingly, the determination circuit 7 can determine that it occurs an abnormal oscillation of the oscillator output signal 21 or the ring oscillator output signal 24. Note that, when it occurs an abnormal oscillation of the oscillator output signal 21, it inevitably occurs an abnormal oscillation of the PLL output signal 22, too.

Moreover, when it occurs a high-speed abnormal oscillation of the frequency divider output signal 23, or it occurs a low-speed abnormal oscillation of the ring oscillator output signal 24, the counter value underflows the third parameter, when the count unit 11 counts down the frequency divider output signal 23 (A in FIG. 2). Therefore, the count unit 11 generates an underflow signal 26 at the underflow, and outputs the underflow signal 26 to the abnormality notice unit 10. Accordingly, the determination circuit 7 can determine that it occurs an abnormal oscillation of the PLL output signal 22 or the ring oscillator output signal 24.

the first determination unit 12 includes a first compare register 121 and a first comparator 122. The first compare register 121 outputs a first threshold value provided beforehand, to the first comparator 122. For example, the first threshold value is set the above-mentioned second parameter. Either, the first threshold value is not always provided the second parameter, may be provided a lower limit to be able to be considered the counter value to be counted up as an abnormal oscillation. The first comparator 122 compares the first threshold value to be input and the counter value at the switching from a counting up operation to a counting down operation. When the counter value is under the first threshold value, the first comparator 122 generates an abnormal oscillation signal 27, and outputs the abnormal oscillation signal 27 to the abnormality notice unit 10. In this case, if the counter value is under the first threshold value, it shows a state of D in FIG. 2. Therefore, the determination circuit 7 can determine that it occurs a low-speed abnormal oscillation of the oscillator output signal 21, or it occurs a high-speed abnormal oscillation of the ring oscillator output signal 24. Note that, when it occurs a low-speed abnormal oscillation of the oscillator output signal 21, it inevitably occurs a low-speed abnormal oscillation of the PLL output signal 22, too.

the second determination unit 13 includes a second compare register 131 and a second comparator 132. The second compare register 131 outputs a second threshold value provided beforehand, to the second comparator 132. For example, the second threshold value is provided the above-mentioned third parameter. Either, the second threshold value is not always provided the third parameter, may be provided an upper limit to be able to be considered the counter value to be counted down as an abnormal oscillation. The second comparator 132 compares the second threshold value to be input and the counter value at the switching from a counting down operation to a counting up operation. When the counter value is over the second threshold value, the second comparator 132 generates an abnormal oscillation signal 28, and outputs the abnormal oscillation signal 28 to the abnormality notice unit 10. In this case, if the counter value is over the second threshold value, it shows a state of B in FIG. 2. Therefore, the determination circuit 7 can determine that it occurs a low-speed abnormal oscillation of the frequency divider output signal 23, or it occurs a high-speed abnormal oscillation of the ring oscillator output signal 24.

The abnormality notice unit 10 generates a signal noticing that it occurs an abnormal oscillation, based on a signal supplied from the determination circuit 7, and outputs the signal to be generated to, for example, the CPU 9.

the semiconductor integrated circuit 1 and the abnormal oscillation detection method for the semiconductor integrated circuit counts up the oscillator output signal 21 and counts down the frequency divider output signal 23, based on the ring oscillator output signal 24. That is, the semiconductor integrated circuit 1 and the abnormal oscillation detection method for the semiconductor integrated circuit can lead a relative relation (correspondence) between the ring oscillator output signal 24 and the oscillator output signal 21, by counting the oscillator output signal 21 for one cycle of the ring oscillator output signal 24. On the other hand, the semiconductor integrated circuit 1 and the abnormal oscillation detection method for the semiconductor integrated circuit can lead a relative relation (correspondence) between the ring oscillator output signal 24 and the frequency divider output signal 23, by counting the frequency divider output signal 23 for one cycle of the ring oscillator output signal 24. Therefore, the semiconductor integrated circuit 1 and the abnormal oscillation detection method for the semiconductor integrated circuit can determine whether either of the oscillator output signal 21, the PLL output signal 22, or the ring oscillator output signal 24 occurs an abnormal oscillation. Furthermore, it is not necessary to add a large circuit compared with a related semiconductor integrated circuit, and it is possible to detect an abnormal oscillation by a circuit, a scale of the circuit is equal to a scale of the related semiconductor integrated circuit.

Second Exemplary Embodiment

A semiconductor integrated circuit 31 according to a second exemplary embodiment is a composition in which the count unit 11 is divided into a count up unit 111 and a count down unit 112, showing in FIG. 3. Note that, redundant explanation thereof is omitted as the semiconductor integrated circuit 31 according to a second exemplary embodiment is the semiconductor integrated circuit 1 according to a first exemplary embodiment and same abbreviation compositions.

The count up unit 111 receives the oscillator output signal 21 and the ring oscillator output signal 24. The count up unit 111 counts up the oscillator output signal 21, until the ring oscillator output signal 24 leads edge next. In this case, when it occurs a high-speed abnormal oscillation of the oscillator output signal 21, or it occurs a low-speed abnormal oscillation of the ring oscillator output signal 24, the counter value overflows the second parameter, when the count up unit 111 counts up the oscillator output signal 21. Therefore, the count up unit 111 generates an overflow signal 25 at the overflow, and outputs the overflow signal 25 to the abnormality notice unit 10.

The count down unit 112 receives the PLL output signal 22 and the ring oscillator output signal 24. In this case, a bit wide of the count down unit 112 is set for a bit wide of the count up unit 111 to differ only by the multiple rate of the PLL 3. In the result, the semiconductor integrated circuit 31 can determine whether either of the PLL output signal 22 or the ring oscillator output signal 24 occurs an abnormal oscillation, to similar abbreviation as the count unit 11 according to a first exemplary embodiment. That is, the count down unit 112 counts down the PLL output signal 22, until the ring oscillator output signal 24 leads edge next. In this case, when it occurs high-speed abnormal oscillation of the PLL output signal 22, or it occurs low-speed abnormal oscillation of the ring oscillator output signal 24, the counter value underflows the third parameter, when the first determination unit 12 counts down the PLL output signal 22. There, the count down unit 112 generates an underflow signal 26 at the underflow, and outputs the underflow signal 26 to the abnormality notice unit 10. Therefore, the semiconductor integrated circuit 31 can determine whether either of the PLL output signal 22 or the ring oscillator output signal 24 occurs an abnormal oscillation.

The semiconductor integrated circuit 31 can omit the frequency divider 5. Therefore, it is possible to contribute to the miniaturization of the semiconductor integrated circuit.

Third Exemplary Embodiment

A semiconductor integrated circuit 32 according to a third exemplary embodiment is a composition in which the abnormality notice unit 10 generates a reset signal 29 and an abnormal detection interruption signal 30, showing in FIG. 4. Note that, redundant explanation thereof is omitted as the semiconductor integrated circuit 32 according to a third exemplary embodiment is the semiconductor integrated circuit 1 according to a first exemplary embodiment and same abbreviation compositions.

The abnormality notice unit 10 generates the reset signal 29 and the abnormal detection interruption signal 30, based on the overflow signal 25, the underflow signal 26, the abnormal oscillation signal 27, and the abnormal oscillation signal 28 supplied from the determination circuit 7. For example, when it occurs a high-speed abnormal oscillation of the oscillator output signal 21, there is a possibility to exceed the operation standard of the semiconductor integrated circuit 32. Therefore, the abnormality notice unit 10 immediately generates the reset signal 29, and outputs the reset signal to a reset generator (not shown) at the subsequent stage, for example. The reset generator outputs the reset signal 29 to the CPU 9.

When the abnormality notice unit 10 receives the others signal, the abnormality notice unit 10 generates the abnormal detection interruption signal 30 and outputs the abnormal detection interruption signal 30 to an interruption controller (not shown) at the subsequent stage as follows, for example. The interruption controller outputs the abnormal detection interruption signal 30 to the CPU 9.

The semiconductor integrated circuit 32 generates the reset signal 29 and the abnormal detection interruption signal 30. Therefore, the semiconductor integrated circuit 32 can arbitrarily select a process after it occurs an abnormal oscillation of the clock.

Note that, the present invention is not limited to the above-described exemplary embodiments, and various modifications can be made as appropriate to the exemplary embodiments without departing from the spirit and scope of the present invention. For example, in the above-mentioned exemplary embodiments, the determination circuit counts up the oscillator output signal, and count down the frequency divider output signal (PLL output signal), but even if it is opposite, it is acceptable.

If a specification has more than third exemplary embodiments, add the following.

The first, second, and third exemplary embodiments can be combined as desirable by one of ordinary skill in the art.

While the invention has been described in terms of several exemplary embodiments, those skilled in the art will recognize that the invention can be practiced with various modifications within the spirit and scope of the appended claims and the invention is not limited to the examples described above.

Further, the scope of the claims is not limited by the exemplary embodiments described above.

Furthermore, it is noted that, Applicant's intent is to encompass equivalents of all claim elements, even if amended later during prosecution. 

What is claimed is:
 1. A semiconductor device comprising: a first oscillator that generates a first clock signal; a second oscillator that generates a second clock signal in response to the first clock signal; a third oscillator that generates a third clock signal; a counter that counts a signal corresponding to the first clock signal or a signal corresponding to the second clock signal during a predetermined period that is set based on the third clock signal to generate an overflow signal indicating that a count value of the signal corresponding to the first clock signal or the signal corresponding to the second clock signal exceeds a predetermined value; and an abnormality notice unit that receives the overflow signal to generate an abnormality signal indicating that an abnormal oscillation occurs in at least one of the first to third clock signals.
 2. The semiconductor device according to claim 1, further comprising: a first compare register that stores a first set value; a first comparator that is coupled to the counter and the first compare register, and that compares the count value of the signal corresponding to the first clock signal with the first set value to generate a first comparison signal indicating that the count value of the signal corresponding to the first clock signal is smaller than the first set value; a second compare register that stores a second set value; and a second comparator that is coupled to the counter and the second compare register, and that compares the count value of the signal corresponding to the second clock signal with the second set value to generate a second comparison signal indicating that the count value of the signal corresponding to the second clock signal is smaller than the second set value; wherein the abnormality notice unit receives the first and second comparison signals to generate the abnormality signal.
 3. The semiconductor device according to claim 2, further comprising: a central processing unit that operates in synchronization with the second clock signal, and that is coupled to the abnormality notice unit, wherein the abnormality notice unit generates a reset signal in response to the overflow signal and an abnormal detection interruption signal in response to the first or second comparison signals.
 4. The semiconductor device according to claim 1, wherein the second oscillator comprises a phase locked loop (PLL) circuit that multiplies the first clock signal.
 5. The semiconductor device according to claim 1, wherein a frequency of the third clock signal is lower than a frequency of each of the first and second clock signals.
 6. The semiconductor device according to claim 1, further comprising: a clock controller that receives the second and third clock signals to output one of the second and third clock signals; and a central processing unit that is coupled to the clock controller to operate in synchronization with one of the second and third clock signals.
 7. The semiconductor device according to claim 1, wherein the counter counts up or counts down the signal corresponding to the first clock signal or the signal corresponding to the second clock signal.
 8. The semiconductor device according to claim 7, wherein the counter switches an up count and a down count in response to the third clock signal.
 9. The semiconductor device according to claim 7, wherein the counter comprises an up counter unit and a down counter unit.
 10. The semiconductor device according to claim 4, further comprising: a frequency divider that divides an output of the PLL circuit based on a multiple rate of the PLL circuit; and a selector that receives an output of the frequency divider and the first clock signal to output one of the output of the frequency divider and the first clock signal to the counter in response to the third clock signal.
 11. A semiconductor comprising: a first oscillator that generates a first clock signal; a second oscillator that generates a second clock signal; a third oscillator that generates a third clock signal; and a determination circuit that receives a clock signal, the clock signal corresponding to the first clock signal and the second clock signal based on the third clock signal, and determines whether an abnormal oscillation occurs in either of the clock signal and the third clock signal.
 12. The semiconductor according to claim 11, further comprising an abnormality notice unit that generates a signal indicating an occurrence of the abnormal oscillation, based on a signal supplied from the determination circuit.
 13. The semiconductor according to claim 11, wherein the determination circuit comprises a counter that counts the clock signal up or down based on the third clock signal.
 14. The semiconductor according to claim 13, further comprising an abnormality notice unit that generates a signal indicating an occurrence of the abnormal oscillation, wherein if a count value of the clock signal exceeds a predetermined value, then the determination circuit outputs an overflow signal, and wherein if the determination circuit outputs the overflow signal, then the abnormality notice unit generates the signal indicating the occurrence of the abnormal oscillation.
 15. The semiconductor according to claim 13, further comprising an abnormality notice unit that generates a signal indicating an occurrence of the abnormal oscillation, wherein if a count value of the clock signal falls below a predetermined value, then the determination circuit outputs an underflow signal, and wherein if the determination circuit outputs the underflow signal, then the abnormality notice unit generates the signal indicating the occurrence of the abnormal oscillation.
 16. A semiconductor comprising: a first oscillator that generates a first clock signal; a second oscillator that generates a second clock signal; a third oscillator that generates a third clock signal; a count unit that receives a clock signal and changes a count value, the clock signal corresponding to the first clock signal or the second clock signal based on the third clock signal; a first determination unit that determines whether the count value is less than a first threshold value; a second determination unit that determines whether the count value is greater than a second threshold value; and an abnormality notice unit that indicates that an abnormal oscillation occurs in at least one of the first, second and third clock signals, based on each determination of the first determination unit and the second determination unit.
 17. The semiconductor according to claim 16, wherein the second oscillator generates the second clock signal in response to the first clock signal.
 18. The semiconductor according to claim 16, wherein the count unit receives the third clock signal, and changes the count value up or down based on the third clock signal.
 19. The semiconductor according to claim 16, wherein the count value is set to a first parameter, when a counting up operation begins, wherein if the count unit is switched from the counting up operation to a counting down operation, then the count value at the switching comprises a second parameter, and wherein if the count value overflows the second parameter, then the abnormality notice unit receives an overflow signal indicating that the abnormal oscillation occurs.
 20. The semiconductor according to claim 16, wherein the count value is set to a third parameter, when a counting down operation finishes, and if the count value underflows the third parameter, then abnormality notice unit receives an underflow signal indicating that the abnormal oscillation occurs. 